Revealing the interference effect of Majorana fermions in a topological Josephson junction.
Revealing the interference effect of Majorana fermions in a topological Josephson junction.
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揭示拓扑约瑟夫森结中马约拉纳费米子的干涉效应
DOI：
10.3762/bjnano.9.50
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发表时间：
2018
影响因子：
3.1
通讯作者：
Song J
中科院分区：
文献类型：
--
作者：
Liu J;Yu T;Song J
从理论上研究了拓扑约瑟夫森结中的局域态密度。我们证明了众所周知的4π约瑟夫森效应源于位于约瑟夫森结处的两个马约拉纳费米子(MF)之间的干涉效应。此外，电子(空穴)的能谱显示了沿每个宇称守恒能谱的4π干涉信息。当两个平凡态相互干扰时，显示出2π的周期振荡。这意味着可以使用DOS信息来区分MFS和微不足道的局部化状态。我们建议使用两个STM导联或两个正常导联来检测干扰效应和DOS。单侧引线只能探测到结中的安德列夫反射隧穿过程，一般不能揭示干涉效应的信息。然而，使用两个侧引线，我们可以通过将安德列夫反射与电子传输过程相结合来揭示MFS和DOS的干扰效应的信息。
We study theoretically the local density of states (DOS) in a topological Josephson junction. We show that the well-known 4π Josephson effect originates from the interference effect between two Majorana fermions (MFs) that are localized at the Josephson junction. In addition, the DOS for electrons (holes) shows the 4π interference information along each parity conserved energy spectrum. The DOS displays a 2π period oscillation when two trivial states interfere with each other. This means that the DOS information may be used to distinguish the MFs from trivial localized states. We suggest that the interference effect and the DOS can be detected by using two STM leads or two normal leads. A single side lead can only detect the Andreev reflection tunneling process in the junction, which cannot reveal information about the interference effect in general. However, using two side leads, we can reveal information about the interference effect of the MFs as well as the DOS by combining Andreev reflection with the electron transmission process.
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