Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles
Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles
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DOI：
10.1002/jms.1482
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发表时间：
2009-01-01
影响因子：
2.3
通讯作者：
Matsuo, Jiro
中科院分区：
文献类型：
--
作者：
Nakata, Yoshihiko;Honda, Yoshiro;Matsuo, Jiro
成像质谱（MS）用于可视化生物组织和细胞中分子种类的空间分布的重要性正在增长。我们已经开发出一种新的系统，用于成像MS使用MeV离子束，称为MeV-二次离子质谱（MeV-SIMS）在这里，并证明了超过1000倍的增加，从肽样品（1154 Da）的分子离子产率，keV离子照射相比。这种显着提高的分子离子产率归因于电子激发诱导的近表面区域的高能离子的影响。此外，生物学上重要化合物（> 1 kDa）的二次离子效率增加到10（10）cm（-2）以上，表明目前的技术原则上可以实现微米级的横向分辨率。除了MeV-SIMS，肽类化合物也分析了簇-SIMS和结果表明，在前一种方法的分子离子产额大幅增加相比，后者。为了评估MeV-SIMS获取重离子图像的能力，我们已经制备了一个微图案化的肽表面，并成功地获得了去质子化肽（m/z 1153）的质谱成像，而没有任何基质增强。在这项研究中获得的结果表明，MeV-SIMS技术可以是一个强大的工具，高分辨率成像的质量范围从100到超过1000 Da。
The importance of imaging mass spectrometry (MS) for visualizing the spatial distribution of molecular species in biological tissues and cells is growing. We have developed a new system for imaging MS using MeV ion beams, termed MeV-secondary ion mass spectrometry (MeV-SIMS) here, and demonstrated more than 1000-fold increase in molecular ion yield from a peptide sample (1154 Da), compared to keV ion irradiation. This significant enhancement of the molecular ion yield is attributed to electronic excitation induced in the near-surface region by the impact of high energy ions. In addition, the secondary ion efficiency for biologically important compounds (> 1 kDa) increased to more than 10(10) cm(-2), demonstrating that the current technique could, in principle, achieve micrometer lateral resolution. In addition to MeV-SIMS, peptide compounds were also analyzed with cluster-SIMS and the results indicated that in the former method the molecular ion yields increased substantially compared to the latter. To assess the capability of MeV-SIMS to acquire heavy-ion images, we have prepared a micropatterned peptide surface and successfully obtained mass spectrometric imaging of the deprotonated peptides (m/z 1153) without any matrix enhancement. The results obtained in this study indicate that the MeV-SIMS technique can be a powerful tool for high-resolution imaging in the mass range from 100 to over 1000 Da. Copyright (c) 2008 John Wiley & Sons, Ltd.