Scanning Electrometer: Mapping of Electric Potential and Its Fluctuation

Scanning Electrometer: Mapping of Electric Potential and Its Fluctuation
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扫描静电计:绘制电势及其波动

DOI:
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发表时间:
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期刊:
Japanese Journal of Applied Physics (Review paper) (accepted for publication)
影响因子:
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通讯作者:
Y. Kawano
Y. Kawano
中科院分区:
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文献类型:
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作者:
Y. Kawano;K. Ishibashi;柳瀬陽一;河野行雄;柳瀬陽一;Y. Kawano

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