High-efficiency scattering probe design for s-polarized near-field microscopy
High-efficiency scattering probe design for s-polarized near-field microscopy
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DOI：
10.35848/1882-0786/abd716
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发表时间：
2021-01
影响因子：
2.3
通讯作者：
Richard Ren;Xinzhong Chen;Mengkun Liu
中科院分区：
文献类型：
--
作者：
Richard Ren;Xinzhong Chen;Mengkun Liu
在传统的散射型扫描近场光学显微镜装置中，原子力显微镜探针不能有效地与s偏振光耦合，导致低信号和有限的面内灵敏度。本研究旨在研究一种对s偏振光和p偏振光都具有增强响应度的高分辨率探针。利用全波电磁矩量法进行模拟。模拟的近场光谱的原型材料（二氧化硅，硅，钛酸锶），以及模拟光栅扫描的间隙纳米天线，表明两个数量级的增加的散射信号的s-偏振入射和检测方案相比，传统的探头。
In a conventional scattering-type scanning near-field optical microscopy setup, the atomic force microscope probe is unable to effectively couple with s-polarized light, resulting in low signal and limited in-plane sensitivity. This study aims to investigate a high-resolution probe with enhanced responsivity to both s- and p-polarized light. Full-wave electromagnetic method of moments simulations are utilized. Simulated near-field spectra on prototypical materials (SiO2, Si, SrTiO3), as well as simulated raster scans of a gap nanoantenna, indicate a two order of magnitude increase of the scattering signal for s-polarized incident and detection scheme compared to the conventional probe.