Giant Peltier Effect in a Submicron-Sized Cu–Ni/Au Junction with Nanometer-Scale Phase Separation
Giant Peltier Effect in a Submicron-Sized Cu–Ni/Au Junction with Nanometer-Scale Phase Separation
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DOI：
10.1143/apex.3.065204
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发表时间：
2010-05
影响因子：
2.3
通讯作者：
A. Sugihara;M. Kodzuka;K. Yakushiji;H. Kubota;S. Yuasa;A. Yamamoto;K. Ando;K. Takanashi;T. Ohkubo;K. Hono;A. Fukushima
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文献类型：
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作者：
A. Sugihara;M. Kodzuka;K. Yakushiji;H. Kubota;S. Yuasa;A. Yamamoto;K. Ando;K. Takanashi;T. Ohkubo;K. Hono;A. Fukushima
我们在亚微米Cu-Ni/Au结中观察到了巨大的Peltier效应。从结中焦耳加热和珀耳帖冷却效应之间的平衡估计，在室温下珀耳帖系数为480 mV，这是从块体Au和Cu-Ni合金的Seebeck系数预期的40倍。这种巨大的冷却效应使结的内部温度降低了160 K。三维原子探针显微结构分析表明，巨珀耳帖效应可能起源于纳米尺度的相分离的Cu-Ni层。
We observed a giant Peltier effect in a submicron Cu–Ni/Au junction. The Peltier coefficient was evaluated to be 480 mV at room temperature from the balance between Joule heating and the Peltier cooling effect in the junction, which is 40 times that expected from the Seebeck coefficients of bulk Au and Cu–Ni alloy. This giant cooling effect lowered the inner temperature of the junction by 160 K. Microstructure analysis with a three-dimensional atom probe suggested that the giant Peltier effect possibly originated from nanometer-scale phase separation in the Cu–Ni layer.