Phase-shift ambiguity in microwave dielectric properties measurements

Phase-shift ambiguity in microwave dielectric properties measurements
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微波介电特性测量中的相移模糊度

DOI:
10.1109/19.836309
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发表时间:
2000
期刊:
IEEE Trans. Instrum. Meas.
影响因子:
--
通讯作者:
S. Nelson
S. Nelson
中科院分区:
--
文献类型:
--
作者:
S. Trabelsi;A. Kraszewski;S. Nelson

文献摘要

被引文献

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当用于材料的介电特性时,透射系数的相位测量是重要的。它们需要用于工业材料监测应用,其中相位与需要连续确定的参数(如水分含量和密度)相关,但是,当被测材料的厚度大于材料中的波长时,就会遇到相位问题。提出了两种方法来解决这个问题。第一种是基于选择适当的材料厚度;第二种需要使用两个频率的测量。讨论了这两种方法的优点和局限性,并对颗粒材料进行了数值验证。
Phase measurements of the transmission coefficient are important when used for the dielectric characterization of materials. They are required for industrial material monitoring applications, where the phase is correlated with parameters such as moisture content and density, which need to be continuously determined, However, when the thickness of the material under test is greater than the wavelength in the material, a phase problem is encountered. Two methods are proposed to solve this problem. The first is based on the selection of the appropriate material thickness; the second requires the use of measurements at two frequencies. Advantages and limitations of both methods are discussed, and numerical validations are given for particulate materials.