DATA REDUCTION AND THERMAL PRODUCT DETERMINATION FOR SINGLE AND MULTI-LAYERED SUBSTRATES THIN-FILM GAUGES
DATA REDUCTION AND THERMAL PRODUCT DETERMINATION FOR SINGLE AND MULTI-LAYERED SUBSTRATES THIN-FILM GAUGES
复制标题
单层和多层基板薄膜测量仪的数据缩减和热产品测定
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
R. Dénos
中科院分区：
文献类型：
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作者：
N. Billiard;V. Iliopoulou;F. Ferrara;R. Dénos
单层和双层基底薄膜测量计可以在短时排污风洞中进行测试时确定壁热通量。提出并验证了一种数值数据缩减技术来求解多层基板的非稳态热传导方程。然后，应用并比较了测定单层或两层基材热性能的不同方法。最后，利用数值技术和确定的热特性，使用两层薄膜测量仪对定子叶片进行测量。
Single and two-layered substrate thin film gages allow the determination of wall heat flux when testing in short duration blowdown wind tunnel. A numerical data reduction technique is proposed and validated to solve the unsteady heat conduction equation with multiple layer substrates. Then, different methods for the determination of the thermal properties of single or two-layered substrates are applied and compared. Finally, the numerical technique and the determined thermal properties are used to perform measurements on a stator blade using two-layered thin film gauges.