Fast ultrahigh-density writing of low-conductivity patterns on semiconducting polymers
Fast ultrahigh-density writing of low-conductivity patterns on semiconducting polymers
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DOI：
10.1038/ncomms3668
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发表时间：
2013-11
影响因子：
16.6
通讯作者：
M. Farina;Tengling Ye;G. Lanzani;A. di Donato;G. Venanzoni;D. Mencarelli;T. Pietrangelo;A. Morini;P. E. Keivanidis
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文献类型：
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作者：
M. Farina;Tengling Ye;G. Lanzani;A. di Donato;G. Venanzoni;D. Mencarelli;T. Pietrangelo;A. Morini;P. E. Keivanidis
对改善数据存储、分子电子学和光电子学的限制的特殊兴趣促进了越来越多用于在微纳米尺度上对聚合物进行图案设计的技术的发展。它们大多依靠原子力显微镜来热或静电诱导质量输运，从而产生地形特征。本研究表明，原子力显微镜尖端与π共轭聚合物薄膜表面之间的机械相互作用产生了分子无序性的局部增加，导致半导体电导率的局部降低，而这与表面形貌的可检测修饰无关。这种现象允许在薄膜表面以超过20 μm s−1的速度快速产生低电导率图案；路径的分辨率以尖端尺寸（20纳米）为顺序，并通过导电原子力显微镜尖端在电导率图中进行检测。
The exceptional interest in improving the limitations of data storage, molecular electronics and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most of them rely on atomic force microscopy to thermally or electrostatically induce mass transport, thereby creating topographic features. Here we show that the mechanical interaction between the tip of the atomic force microscope and the surface ofπ-conjugated polymeric films produces a local increase of molecular disorder, inducing a localized lowering of the semiconductor conductivity, not associated to detectable modifications in the surface topography. This phenomenon allows for the swift production of low-conductivity patterns on the film surface at a speed exceeding 20 μm s−1; paths have a resolution in the order of the tip size (20 nm) and are detected by a conducting-atomic force microscopy tip in the conductivity maps.