Modeling of board-level package by Finite Element Analysis and laser interferometer measurements
Modeling of board-level package by Finite Element Analysis and laser interferometer measurements
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DOI:
10.1016/j.microrel.2010.03.009
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发表时间:
2010-07
期刊:
影响因子:
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通讯作者:
Bo Zhang-;Pinkuan Liu;H. Ding;W. Cao
中科院分区:
文献类型:
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作者:
Bo Zhang-;Pinkuan Liu;H. Ding;W. Cao