Modeling of board-level package by Finite Element Analysis and laser interferometer measurements

Modeling of board-level package by Finite Element Analysis and laser interferometer measurements
复制标题

DOI:
10.1016/j.microrel.2010.03.009
复制
发表时间:
2010-07
期刊:
Microelectron. Reliab.
影响因子:
--
通讯作者:
Bo Zhang-;Pinkuan Liu;H. Ding;W. Cao
Bo Zhang-;Pinkuan Liu;H. Ding;W. Cao
中科院分区:
其他
文献类型:
--
作者:
Bo Zhang-;Pinkuan Liu;H. Ding;W. Cao

文献摘要

被引文献

相似文献