Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy
Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy
复制标题
用扫描力显微镜检测铁电域的对比机制
DOI：
10.1088/1367-2630/11/3/033029
复制
发表时间：
2008
影响因子：
3.3
通讯作者：
E. Soergel
中科院分区：
文献类型：
--
作者：
T. Jungk;Á. Hoffmann;E. Soergel
我们提出了一个全面的分析的对比度机制，用于检测铁电畴的所有（x，y和z）面的大块单晶体使用扫描力显微镜。实验是用六角极化的铁酸锂进行的，以确保在每个晶面上获得明确的畴结构。域对比度可以归因于三种不同的机制：（i）由于平面外压电响应（标准压电响应力显微镜）的样品的厚度变化，（ii）由于平面内压电响应的样品表面的横向位移和（iii）静电尖端-样品相互作用在域边界引起的表面电荷的结晶y-和z-面。仔细分析的悬臂相对于其取向相对于样品的结晶轴的运动允许清晰的归因所观察到的域对比的驱动力。
We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all (x, y and z) faces of bulk single crystals using scanning force microscopy. The experiments were carried out with hexagonally poled lithium niobate to ensure access to a well-defined domain structure on every crystal face. The domain contrast can be attributed to three different mechanisms: (i) the thickness change of the sample due to an out-of-plane piezoelectric response (standard piezoresponse force microscopy), (ii) the lateral displacement of the sample surface due to an in-plane piezoresponse and (iii) the electrostatic tip–sample interaction at the domain boundaries caused by surface charges on the crystallographic y- and z-faces. A careful analysis of the movement of the cantilever with respect to its orientation relative to the crystallographic axes of the sample allows clear attribution of the observed domain contrast to the driving forces.