Theory and Application of Point-Diffraction Interferometers
Theory and Application of Point-Diffraction Interferometers
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DOI：
10.7567/jjaps.14s1.351
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发表时间：
1975
影响因子：
1.5
通讯作者：
R. Smartt;W. H. Steel
中科院分区：
文献类型：
--
作者：
R. Smartt;W. H. Steel
点衍射干涉仪是用于测量相位变化的干涉仪，其中参考波由光束路径中的点不连续性产生。它的简单性使得它非常适合在现场测试仪器，并描述了一些这样的测试。一般的理论表明，其他衍射孔可以使用，并涉及到相衬显微镜和散射板干涉测量技术。
The point-diffraction interferometer is an interferometer for measuring phase variations in which the reference wave is produced by a point discontinuity in the path of the beam. Its simplicity makes it very suitable for testing instruments in situ, and some such tests are described. The general theory shows that other diffracting apertures can be used and relates the technique to phase-contrast microscopy and to scatter-plate interferometry.