ELEMENT-SPECIFIC MAGNETIC MICROSCOPY WITH CIRCULARLY POLARIZED X-RAYS
ELEMENT-SPECIFIC MAGNETIC MICROSCOPY WITH CIRCULARLY POLARIZED X-RAYS
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DOI：
10.1126/science.259.5095.658
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发表时间：
1993-01-29
期刊：
影响因子：
56.9
通讯作者：
TONNER, BP
中科院分区：
文献类型：
--
作者：
STOHR, J;WU, Y;TONNER, BP
圆偏振软X射线已被用于与成像光电子显微镜记录图像的磁畴在1微米的空间分辨率。磁对比度，这可能是非常大的，产生的事实，即在对齐的磁性原子的内壳层吸收边缘的X射线吸收截面取决于光子自旋和局部磁化方向的相对取向。该技术是特定元素的，并且由于X射线和二次电子的长平均自由程，它可以记录埋磁层的图像。
Circularly polarized soft x-rays have been used with an imaging photoelectron microscope to record images of magnetic domains at a spatial resolution of 1 micrometer. The magnetic contrast, which can be remarkably large, arises from the fact that the x-ray absorption cross section at inner-shell absorption edges of aligned magnetic atoms depends on the relative orientation of the photon spin and the local magnetization direction. The technique is element-specific, and, because of the long mean free paths of the x-rays and secondary electrons, it can record images of buried magnetic layers.