“Dual contrast mode” imaging of anatase TiO2(001) − (1 × 4) reconstructed surface using non-contact atomic force microscopy
“Dual contrast mode” imaging of anatase TiO2(001) − (1 × 4) reconstructed surface using non-contact atomic force microscopy
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DOI：
10.7567/1347-4065/ab1071
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发表时间：
2019-06
影响因子：
1.5
通讯作者：
Daiki Katsube;M. Abe
中科院分区：
文献类型：
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作者：
Daiki Katsube;M. Abe
研究了非接触原子力显微镜（AFM）对TiO2（001）−（1 × 4）重构表面的不同成像模式。除了先前报道的三种典型的成像模式（突起，孔和中性模式），我们获得了“双对比度”模式图像，其中两个不同的尖端顶点原子提供对比度。新的成像模式具有以不同的空间分辨率采集的两个原子行。
Different imaging modes of anatase TiO2(001) − (1 × 4) reconstructed surface obtained with non-contact atomic force microscopy are investigated. In addition to the three typical types of imaging mode (protrusion, hole, and neutral modes) previously reported, we obtained “dual contrast” mode images in which two different tip apex atoms provide contrast. The new imaging mode has two atomic rows that are acquired in different spatial resolutions.