In-situ TEM study of the aging micromechanisms in a BaTiO3-based lead-free piezoelectric ceramic

In-situ TEM study of the aging micromechanisms in a BaTiO3-based lead-free piezoelectric ceramic
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DOI:
10.1016/j.jeurceramsoc.2018.03.049
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发表时间:
2018-08
影响因子:
5.7
通讯作者:
Z. Fan;X. Tan
Z. Fan;X. Tan
中科院分区:
材料科学1区
文献类型:
--
作者:
Z. Fan;X. Tan

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老化和疲劳是影响压电陶瓷性能可靠性的两个主要因素。与疲劳相比,人们对衰老的微观机制的研究较少。在这份报告中,我们采用电场原位透射电子显微镜(TEM)直接可视化畴结构的演变过程中的疲劳和随后的老化过程中的0.5Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO 3(BZT-BCT)多晶陶瓷。宏观老化行为,包括内部偏置场(Ebias)的发展和可切换极化(2 Pr)的退化,与微观畴壁夹持和畴破裂有关,畴壁夹持和畴破裂是由去极化场驱动的氧空位重新分布引起的。
Aging and fatigue are the two main concerns regarding the performance reliability of piezoelectric ceramics. Compared with fatigue, less efforts have been made towards clarifying the micromechanisms of aging. In this report, we employ electric fieldin-situtransmission electron microscopy (TEM) to directly visualize the domain structure evolution during fatigue and the subsequent aging process in the 0.5Ba(Zr0.2Ti0.8)O3–0.5(Ba0.7Ca0.3)TiO3(BZT–BCT) polycrystalline ceramic. The macroscopic aging behaviors, including the development of internal bias field (Ebias) and the degradation in switchable polarization (2Pr), are correlated with the microscopic domain wall clamping and domain disruption resulted from the redistribution of oxygen vacancies driven by depolarization field.