Probing charge transport and background doping in MOCVD grown (010) ${eta}$-Ga$_{2}$O$_{3}$
Probing charge transport and background doping in MOCVD grown (010) ${eta}$-Ga$_{2}$O$_{3}$
复制标题
探测 MOCVD 生长 (010) ${eta}$-Ga$_{2}$O$_{3}$ 中的电荷传输和背景掺杂
DOI:
--
复制
发表时间:
2020
期刊:
影响因子:
--
通讯作者:
Hongping Zhao
中科院分区:
文献类型:
--
作者:
Zixuan Feng;A. Bhuiyan;Zhanbo Xia;Wyatt Moore;Zhaoying Chen;Joe F. Mcglone;D. Daughton;A. Arehart;S. Ringel;S. Rajan;Hongping Zhao
A new record-high room temperature electron Hall mobility (${mu}_{RT} = 194space cm^{2}/Vspace s$ at $nsim 8 imes 10^{15}space cm^{-3}$) for ${eta}$-Ga2O3 is demonstrated in the unintentionally doped thin film grown on (010) semi-insulating substrate via metalorganic chemical vapor deposition (MOCVD). A peak electron mobility of $sim 9500space cm^{2}/Vspace s$ is achieved at 45 K. Further investigation on the transport properties indicate the existence of sheet charges near the epi-layer/substrate interface. Si is identified as the primary contributor to the background carrier in both the epi-layer and the interface, originated from both surface contamination as well as growth environment. Pre-growth hydrofluoric acid cleaning of the substrate lead to an obvious decrease of Si impurity both at interface and in epi-layer. In addition, the effect of MOCVD growth condition, particularly the chamber pressure, on the Si impurity incorporation is studied. A positive correlation between the background charge concentration and the MOCVD growth pressure is confirmed. It is noteworthy that in a ${eta}$-Ga2O3 film with very low bulk charge concentration, even a reduced sheet charge density can play an important role in the charge transport properties.