X-ray diffraction to determine the thickness of raft and nonraft bilayers.
X-ray diffraction to determine the thickness of raft and nonraft bilayers.
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X 射线衍射测定筏和非筏双层的厚度。
DOI：
10.1007/978-1-59745-513-8_15
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发表时间：
2007
期刊：
影响因子：
--
通讯作者：
McIntosh,ThomasJ
中科院分区：
文献类型：
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作者：
McIntosh,ThomasJ
低角X射线衍射是分析膜双层结构的有力手段。具体地说，该技术可用于准确地确定完全水合的双层的厚度。本文详细介绍了这种技术如何可以测量双层的抗洗涤剂膜和洗涤剂可溶性膜的厚度差异，从已知包含筏和nonraft域的模型系统中提取。观察到的厚度差异可能是至关重要的跨膜蛋白之间的筏和nonraft双层的排序。
Low-angle X-ray diffraction is a powerful method to analyze the structure of membrane bilayers. Specifically, the technique can be used to determine accurately the thickness of fully hydrated bilayers. Herein details are presented showing how this technique can measure the difference in thickness of bilayers in detergent-resistant membranes and detergent-soluble membranes extracted from model systems known to contain both raft and nonraft domains. The observed thickness difference may be critical in the sorting of transmembrane proteins between raft and nonraft bilayers.