Calibrating clock stretch during AC scan testing
Calibrating clock stretch during AC scan testing
复制标题
交流扫描测试期间校准时钟延伸
DOI：
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复制
发表时间：
2005
期刊：
影响因子：
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通讯作者：
R. Rodgers
中科院分区：
文献类型：
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作者：
J. Rearick;R. Rodgers
延迟故障测试通过AC扫描示出遭受测试应用的问题，如果不占，将导致测试质量的降低。时钟周期拉伸的问题进行了论证，并描述了一种新的电路，用于校准这种效果。介绍了交流扫描测试在测试仪上的应用指南，以提高交流扫描测试的质量，沿着了几个大型ASIC的测试结果
Delay fault testing via AC scan is shown to suffer from test application problems that, if not accounted for, will cause a reduction in test quality. The problem of clock period stretching is demonstrated, and a novel circuit for calibrating this effect is described. Guidelines for AC scan test application on the tester to improve the quality of AC scan tests are presented, along with results from several large ASICs