SAT-based analysis of sensitisable paths
SAT-based analysis of sensitisable paths
复制标题
基于 SAT 的敏感路径分析
DOI：
10.1109/ddecs.2011.5783055
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
B. Becker
中科院分区：
文献类型：
--
作者：
M. Sauer;A. Czutro;Tobias Schubert;Stefan Hillebrecht;I. Polian;B. Becker
纳米技术中的制造缺陷具有高度复杂的时序行为，并且还受工艺变化的影响。虽然传统观点认为，通过最长的敏感路径来检测延迟缺陷是最佳的，但在测试生成过程中，非平凡缺陷行为以及建模不准确性需要考虑长度控制良好的路径。我们提出了一种通用的方法，通过用户指定长度的所有敏感路径产生测试。所得到的测试可以在自适应测试的框架内使用。该方法基于将问题编码为布尔可满足性（SAT）实例，从而利用了SAT求解技术的最新进展。
Manufacturing defects in nanoscale technologies have highly complex timing behaviour that is also affected by process variations. While conventional wisdom suggests that it is optimal to detect a delay defect through the longest sensitisable path, non-trivial defect behaviour along with modelling inaccuracies necessitate consideration of paths of well-controlled length during test generation. We present a generic methodology that yields tests through all sensitisable paths of user-specified length. The resulting tests can be employed within the framework of adaptive testing. The methodology is based on encoding the problem as a Boolean-satisfiability (SAT) instance and thereby leverages recent advances in SAT-solving technology.