Electron paramagnetic resonance of erbium doped silicon
Electron paramagnetic resonance of erbium doped silicon
复制标题
掺铒硅的电子顺磁共振
DOI:
10.1063/1.117127
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发表时间:
1996
影响因子:
4
通讯作者:
S. Coffa
中科院分区:
文献类型:
--
作者:
J. D. Carey;J. Donegan;R. Barklie;F. Priolo;G. Franzò;S. Coffa
Electron paramagnetic resonance measurements have been made on samples of float zone silicon, implanted with 10^15 Er/cm2. One sample was coimplanted with oxygen to give an impurity concentration of 10^20 O/cm3 and 10^19 Er/cm3. In this coimplanted sample, sharp lines are observed which are identified as arising from a single spin 1/2 Er3+ center having a g tensor exhibiting monoclinic C1h symmetry. The principal g values and tilt angle are g1=0.80, g2=5.45, g3=12.60, and τ=2.6°. In the absence of O, the sharp lines are not observed. No Er3+ cubic centers were detected in either sample. Possible structures for the center are discussed