A light scattering model for total internal reflection microscopy of geometrically anisotropic particles
A light scattering model for total internal reflection microscopy of geometrically anisotropic particles
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DOI：
10.1080/09500340.2019.1605005
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发表时间：
2019-06-07
影响因子：
1.3
通讯作者：
Wriedt, Thomas
中科院分区：
文献类型：
--
作者：
Doicu, Adrian;Vasilyeva, Alina A.;Wriedt, Thomas
在本文中，描述了全内反射显微镜（TIRM）的光散射模型。该模型处理位于平面附近渐逝场中任意方向的轴对称粒子的散射，以及通过显微镜光学器件对散射光的成像。利用β矩阵法和球面矢量波函数的旋转加定理解决了散射问题，并利用德拜衍射积分计算了散射场的图像。数值模拟提供了 TIRM 两种工作状态的证据：第一种状态，对应于小于全内反射临界角的入射角，提供有关颗粒尺寸和方向的信息，而第二种状态，对应于大于全内反射临界角的入射角，建议用于测量颗粒与平面之间的距离。
In this paper, a light scattering model for Total Internal Reflection Microscopy (TIRM) is described. The model handles the scattering by an axisymmetric particle of arbitrary orientation situated in the evanescent field near a plane surface, and the imaging of the scattered light via microscope optics. The scattering problem is solved by using the -matrix method and the rotation addition theorem for spherical vector wave functions, while the image of the scattered field is computed by using the Debye diffraction integral. The numerical simulations provide evidence of two working regimes for TIRM: the first regime, corresponding to an incident angle less than the critical angle of total internal reflection, provides information on the size and the orientation of the particle, while the second regime, corresponding to an incident angle larger than the critical angle of total internal reflection, is recommended for measuring the distance between the particle and plane surface.