Wavelength and Phase Detection Based SMS Fiber Sensors Optimized With Etching and Nanodeposition
Wavelength and Phase Detection Based SMS Fiber Sensors Optimized With Etching and Nanodeposition
复制标题
DOI：
10.1109/jlt.2017.2719923
复制
发表时间：
2017-09-01
影响因子：
4.7
通讯作者：
Botero-Cadavid, Juan F.
中科院分区：
文献类型：
--
作者：
Cardona-Maya, Yamile;Del Villar, Ignacio;Botero-Cadavid, Juan F.
分析了在单模-多模-单模光纤结构上采用氟化氢蚀刻和溅射沉积氧化铟锡薄膜研制的光纤折射计，旨在提高对外部介质折射率（RI）变化的灵敏度。该器件对周围介质的 RI 变化很敏感，可以通过跟踪衰减带的光谱变化或通过快速傅里叶变换 (FFT) 分析来监测。通过使用光谱分析仪结合简单的FFT测量技术，实现了同时实时监测。结果表明，灵敏度取决于薄膜厚度。在 1.32-1.35RIU 范围内达到了最大值 1442 nm/RIU（折射率单位）。此外，还进行了理论分析，其中模拟与实验结果相匹配。作为所开发的光纤结构的实际应用，已经实现了糖度（度Bx）传感器，其灵敏度分别为2.13 nm/度Bx和0.25 rad/度Bx，用于波长和相移检测。
The development of an optical fiber refractometer by hydrogen fluoride etching and sputtering deposition of a thin-film of indium tin oxide on a single-mode-multimode-single-mode fiber structure has been analyzed with the aim of improving the sensitivity to the changes of the refractive index (RI) of the external medium. The device is sensitive to the RI changes of the surrounding medium, which can be monitored by tracking the spectral changes of an attenuation band or with a fast Fourier transform (FFT) analysis. By using an optical spectrum analyzer combined with a simple FFT measurement technique, the simultaneous realtime monitoring is achieved. The results show that the sensitivity depends on the thin-film thickness. A maximum of 1442 nm/RIU (refractive index unit) in the 1.32-1.35RIUrange has been attained. In addition, a theoretical analysis has been performed, where simulationsmatched with the experimental results. As a practical application of the developed optical fiber structure, a degrees Brix (degrees Bx) sensor has been implemented with a sensitivity of 2.13 nm/degrees Bx and 0.25 rad/degrees Bx respectively for wavelength and phase shift detection.