Intermediate band materials obtained by rapid thermal process of Co-implanted silicon
Intermediate band materials obtained by rapid thermal process of Co-implanted silicon
复制标题
共注入硅快速热处理获得的中能带材料
DOI:
10.1016/j.matlet.2017.08.095
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发表时间:
2017
影响因子:
3
通讯作者:
Zhou Lang
中科院分区:
文献类型:
--
作者:
Yuan Jiren;Huang Haibin;Deng Xinhua;Gong Mingang;Liu Cuicui;Yue Zhihao;Gao Chao;Zhou Naigen;Zhou Lang
The intermediate band solar cell (IBSC) is a kind of novel photovoltaic device with very high efficiency limit. The intermediate band (IB) material is a key factor for fabricating high-performance IBSC. We explore to prepare IB material by Co implantation in silicon followed by a rapid thermal process (RTP). The results show that an IB is successfully formed in Si layer. The IB is located at about 0.3 eV above the valence band edge. Moreover, no impurity phase is formed in the samples. Our results indicated that it is effective to form IB materials with the combination of ion implantation and RTP method. This approach is attractive since the RTP technique is beneficial to fabricate IB materials with thick impurity layers and convenient to use for mass production.