Carrier Mobilities in Insulating Polymers Measured by Time of Flight Method
Carrier Mobilities in Insulating Polymers Measured by Time of Flight Method
复制标题
通过飞行时间法测量绝缘聚合物中的载流子迁移率
DOI：
10.1143/jjap.14.39
复制
发表时间：
1975
影响因子：
1.5
通讯作者：
Y. Inuishi
中科院分区：
文献类型：
--
作者：
K. Hayashi;K. Yoshino;Y. Inuishi
采用脉冲电子束轰击的飞行时间法研究了PET、PS等几种绝缘聚合物的载流子迁移率。例如，在1 ~ 2 MV/cm的电场中，电子的迁移率为2×10-5 cm2/V·sec，在27°C的PET中，空穴的迁移率为1×10-4 cm2/V·sec，活化能约为0.3 eV。在低场下，主要观察到由于脱陷导致的慢载流子分量，这显然使迁移率低得多。根据Hecht曲线估计载流子寿命。研究发现，分子结构严重影响量子产率（每个碰撞电子诱导载流子数）。
Carrier mobilities of several insulating polymers such as PET, PS were studied by the time of flight method using pulsed electron beam bombardment. For example, the mobilities obtained in an electric field of 1∼2 MV/cm were 2×10-5 cm2/V·sec for the electron and 1×10-4 cm2/V·sec for the hole at 27 °C in PET with the activation energy around 0.3 eV. At low field mainly the slow carrier component due to detrapping was observed, which apparently gave a much lower mobility. The carrier lifetime was also estimated from the Hecht curve. It was found that the quantum yield (number of induced carriers per impinging electron) was influenced seriously by the molecular structure.