Investigation of grain boundary grooves at the solid-liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging
Investigation of grain boundary grooves at the solid-liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging
复制标题
多晶硅定向凝固过程中固液界面晶界槽的研究：X射线成像原位表征
DOI：
10.1016/j.jcrysgro.2013.05.023
复制
发表时间：
2013
影响因子：
1.8
通讯作者：
J. Baruchel
中科院分区：
文献类型：
--
作者：
A. Tandjaoui;N. Mangelinck;G. Reinhart;B. Billia;T. Lafford;J. Baruchel
