Instability and Pattern Formation Induced in Thin Crystalline Layers of a Conducting Polymer P3HT by Unstable Carrier Films of an Insulating Polymer
Instability and Pattern Formation Induced in Thin Crystalline Layers of a Conducting Polymer P3HT by Unstable Carrier Films of an Insulating Polymer
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DOI：
10.1021/jp305982x
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发表时间：
2012-10
影响因子：
3.7
通讯作者：
Lin Xu;Ashutosh Sharma;S. Joo
中科院分区：
文献类型：
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作者：
Lin Xu;Ashutosh Sharma;S. Joo
我们研究了硅片上P3HT/聚苯乙烯(PS)双层膜(∼100 nm)的稳定性、自组织形态和脱湿动力学。导电聚合物P3HT或区域规则聚(3-己基噻吩基)的薄膜通过不稳定的PS底层的去湿而驱动微结构的形成。最终，去湿导致形成一种波状的P3HT传导皮肤，覆盖在PS的孤立岛屿上。结构的特征长度尺度与PS底层的厚度成线性关系。空穴生长动力学研究表明，P3HT/PS双层膜的滑移行为不同于没有P3HT覆盖层时的无滑移行为。PS层被P3HT层约束而产生的弯曲弹性和滑移强烈地影响了去湿过程的长度、尺度和动力学。
We investigate the stability, self-organized morphology, and kinetics of dewetting in a thin polymer bilayer (∼100 nm) of P3HT/polystyrene (PS) supported on Si wafers. The thin film of the conducting polymer, P3HT or regioregular poly(3-hexylthiophene), is driven to microstructure formation by dewetting of the unstable PS underlayer. Eventually, dewetting results in the formation of an undulating P3HT conducting skin covering the isolated islands of PS. The characteristic length scale of the structure is linearly proportional to the thickness of the PS underlayer. The kinetics of hole growth shows that the slippage behavior of the P3HT/PS bilayer which is different from the no-slip seen without the presence of the P3HT over layer. The bending elasticity and slippage induced by confinement of the PS layer by the P3HT layer strongly influence the length scale and kinetics of the dewetting process.