Pixellated Cd(Zn)Te high-energy X-ray instrument
Pixellated Cd(Zn)Te high-energy X-ray instrument
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DOI：
10.1088/1748-0221/6/12/c12009
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发表时间：
2011-12-01
影响因子：
1.3
通讯作者：
Veale, M. C.
中科院分区：
文献类型：
--
作者：
Seller, P.;Bell, S.;Veale, M. C.
我们已经开发了一种像素化的高能X射线探测器仪器，可用于各种成像应用。该仪器由一个碲锌镉或碲化镉（Cd（Zn）Te）探测器组成，该探测器凸点键合到一个大面积ASIC上，并与一个高性能数据采集系统封装在一起。每个250 μ m × 250 μ m的80 × 80像素在59.5 keV下给出优于1 keV的FWHM能量分辨率，在141 keV下给出优于1.5 keV的FWHM能量分辨率，同时提供高速成像性能。该系统使用相对简单的引线键合互连方案，但正在升级，以允许使用具有非常小死区的多个模块。读出系统和新的互连技术的描述，以及该系统是如何在几个目标应用程序中执行。
We have developed a pixellated high energy X-ray detector instrument to be used in a variety of imaging applications. The instrument consists of either a Cadmium Zinc Telluride or Cadmium Telluride (Cd(Zn)Te) detector bump-bonded to a large area ASIC and packaged with a high performance data acquisition system. The 80 by 80 pixels each of 250 mu m by 250 mu m give better than 1 keV FWHM energy resolution at 59.5 keV and 1.5 keV FWHM at 141 keV, at the same time providing a high speed imaging performance. This system uses a relatively simple wire-bonded interconnection scheme but this is being upgraded to allow multiple modules to be used with very small dead space. The readout system and the novel interconnect technology is described and how the system is performing in several target applications.