Reliability- and Process-Variation Aware Design of VLSI Circuits
Reliability- and Process-Variation Aware Design of VLSI Circuits
复制标题
DOI：
10.1109/ipfa.2007.4378050
复制
发表时间：
2007-07
期刊：
影响因子：
--
通讯作者：
M. Alam;K. Kang;B. Paul;K. Roy
中科院分区：
文献类型：
--
作者：
M. Alam;K. Kang;B. Paul;K. Roy
我们回顾文献的可靠性和工艺变化意识的VLSI设计，发现一个令人兴奋的研究/应用领域正在迅速成为IC设计的核心课题。具有不可靠元件的可靠电路的设计是一个重大的挑战，从现在开始，它可能仍然与所有电路设计相关，因此在该领域的任何贡献都可能对集成电路的设计理念产生持久的影响。
We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable component is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect of the design philosophy of integrated circuits