Structure of the defect layers in the oxide compound (Ca0.3Sr0.7)0.95CuO2-z.
Structure of the defect layers in the oxide compound (Ca0.3Sr0.7)0.95CuO2-z.
复制标题
氧化物(Ca0.3Sr0.7)0.95CuO2-z 中缺陷层的结构。
DOI：
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发表时间：
1995
期刊：
影响因子：
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通讯作者：
Nissen
中科院分区：
文献类型：
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作者：
Tao;Nissen
通过动态对比度模拟研究了化合物中经常存在的经过实验验证的缺陷层的结构 (${mathrm{Ca}}_{0.3}$${mathrm{Sr}}_{0.7}$${)}_{0.95}$${mathrm{CuO}}_{2mathrm{ensuremath{-}}mathit{z}}$。这项研究的结果表明，在缺陷层中，根据退火条件，顶端氧原子的占有率可能不同。该结构的这一特定特征导致氧化和还原样品中出现空穴掺杂和电子掺杂超导性（分别为${mathrm{Ca}}_{0.3}$${mathrm{Sr}}_{0.7}$${)}_{0.95}$${mathrm{CuO}}_{2mathrm{ensuremath{-}}mathit{z}}$。
The structure of experimentally verified defect layers frequently present in the compound (${mathrm{Ca}}_{0.3}$${mathrm{Sr}}_{0.7}$${)}_{0.95}$${mathrm{CuO}}_{2mathrm{ensuremath{-}}mathit{z}}$ is investigated by means of dynamical contrast simulations. The results of this study reveal that, in the defect layers, the apical oxygen atoms may have a varying occupancy depending on the annealing conditions. This specific feature of the structure results in hole-doped as well as electron-doped superconductivity occurring in the oxidized and in the reduced specimen (${mathrm{Ca}}_{0.3}$${mathrm{Sr}}_{0.7}$${)}_{0.95}$${mathrm{CuO}}_{2mathrm{ensuremath{-}}mathit{z}}$, respectively.