Timing jitter and bit errors in a 64-bit circular shift register
Timing jitter and bit errors in a 64-bit circular shift register
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64 位循环移位寄存器中的时序抖动和位错误
DOI：
10.1109/77.783836
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发表时间：
1999
影响因子：
1.8
通讯作者：
M. Bocko
中科院分区：
文献类型：
--
作者：
A. M. Herr;M. Feldman;M. Bocko
测量了工作在10 - 16 GHz时钟频率下的64位单通量量子循环移位寄存器的误码率。误差发生率取决于时钟和数据偏置电流的值以及时钟频率。由热抖动引起的时序违规是主要的误差机制。基于错误率数据，每个JTL级的抖动估计为290 fs。这对应于8 - 9 K的噪声温度。
The bit-error rate of a 64-bit single-flux-quantum circular shift register, operating at a clock frequency of 10-16 GHz was measured. Error incidence depends on the values of the clock and data bias currents and on the clock frequency. Timing violation arising from thermal jitter is the dominant error mechanism. The jitter per JTL stage is estimated to be 290 fs based on the error rate data. This corresponds to a noise temperature of 8-9 K.