Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image

Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image
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DOI:
10.1038/nmat4087
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发表时间:
2014-11-01
期刊:
影响因子:
41.2
通讯作者:
Thust, A.
Thust, A.
中科院分区:
材料科学1区
文献类型:
--
作者:
Jia, C. L.;Mi, S. B.;Thust, A.

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虽然纳米级晶体的整体原子结构原则上可以通过现代透射电子显微镜获得,但精确测定其表面结构是一个复杂的问题。在这里,我们展示了像差校正的透射电子显微镜,结合专用的数值评估程序,允许仅从一个单一的高分辨率图像确定薄的MgO晶体的三维形状。重建过程的灵敏度不仅足以揭示晶体的表面形貌与原子分辨率,而且还可以检测到吸附杂质原子的存在。我们介绍的单像方法为辐射敏感晶体的三维研究提供了重要的优势。
Although the overall atomic structure of a nanoscale crystal is in principle accessible by modern transmission electron microscopy, the precise determination of its surface structure is an intricate problem. Here, we show that aberration-corrected transmission electron microscopy, combined with dedicated numerical evaluation procedures, allows the three-dimensional shape of a thin MgO crystal to be determined from only one single high-resolution image. The sensitivity of the reconstruction procedure is not only sufficient to reveal the surface morphology of the crystal with atomic resolution, but also to detect the presence of adsorbed impurity atoms. The single-image approach that we introduce offers important advantages for three-dimensional studies of radiation-sensitive crystals.