Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy.
Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy.
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DOI：
10.1364/oe.22.018914
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发表时间：
2014-08
期刊：
影响因子：
3.8
通讯作者：
T. D. Rosso;J. E. H. Sánchez;R. S. Carvalho;Omar Pandoli;Marco Cremona
中科院分区：
文献类型：
--
作者：
T. D. Rosso;J. E. H. Sánchez;R. S. Carvalho;Omar Pandoli;Marco Cremona
我们证明，表面等离子体共振光谱可用于准确、同时测定透明热沉积有机薄膜的厚度和折射率。实验方法基于两种金属沉积或两种厚度方法。这些方法已应用于含有商用三(8-羟基喹啉) (Alq3) 薄膜的封装样品。测量的准确性取决于薄膜沉积过程的控制，建议使用 SPR 光谱作为小分子有机薄膜的廉价且有价值的计量工具。
We demonstrate that Surface Plasmon Resonance spectroscopy can be used for the accurate and simultaneous determination of the thickness and refractive index of transparent thin thermally deposited organic films. The experimental approach is based on a two-metal deposition or a two-thickness method. These methods have been applied to an encapsulated sample containing a thin film of commercial tris(8-hydroxyquinoline) (Alq3). The accuracy of the measurement depends on the control of the film deposition process and suggests the use of SPR spectroscopy as inexpensive and valuable metrology tool for small molecule organic thin films.