BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm
BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm
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具有增强测试方案和无故障区域查找算法的基于 BIST 的 PCM 故障诊断
DOI：
10.1109/tvlsi.2020.2986469
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发表时间：
2020-07-01
影响因子：
2.8
通讯作者：
Song, Zhitang
中科院分区：
文献类型：
--
作者：
Xie, Chenchen;Li, Xi;Song, Zhitang
相变存储器（PCM）技术作为非易失性存储器中最有前途的候选技术之一，在市场应用中显示出巨大的性能优势。然而，传统的测试方法已经跟不上发展的步伐。本文针对PCM的具体故障和其他故障，提出了一种增强的行军测试算法，以实现面向位的PCM 100%的故障覆盖率和诊断准确率。然后将该算法转换为面向词的PCM，并具有检测潜在词内影响的能力。此外，为了降低存储器测试对外部设备的依赖，设计了一种新的故障信息存储方案。通过c语言的建模和仿真，证明了该方法可以提高在测试内存中找到预定义无故障区域的概率。最后，结合改进的测试算法和新的存储方案，提出了一种内置自检（BIST）行军测试方案，实现了PCM无需任何外部设备的独立测试。通过对比，用c语言进行的实验结果表明，所提出的测试方案不仅提高了故障覆盖率和诊断准确率，而且减少了额外的面积开销。
As one of the most promising candidates for nonvolatile memory, phase change memory (PCM) technology has shown great performance advantages in market applications. However, the conventional test methods have not kept pace with the development. In this article, focusing on specific PCM faults and others, an enhanced march test algorithm is proposed to achieve 100% fault coverage and diagnostic accuracy in bit-oriented PCM. The proposed algorithm is then converted for word-oriented PCM and equipped with capability to detect potential intraword impact. In addition, to reduce the dependence of memory test on the external devices, a novel storage scheme of fault information is devised. Through the modeling and simulation in C-language, this method is proven to improve the probability of finding the predefined fault-free regions in the tested memory. Finally, combining the enhanced test algorithm and the novel storage scheme, a built-in self-test (BIST) march test scheme is proposed, realizing the independent test of PCM without any external equipment. By comparison, the result of experiments, which are performed with C-language, proves that the proposed test scheme not only increases the fault coverage and diagnostic accuracy, but also reduces the additional area overhead.