Origins of hydrogen that passivates bulk defects in silicon heterojunction solar cells
Origins of hydrogen that passivates bulk defects in silicon heterojunction solar cells
复制标题
钝化硅异质结太阳能电池中体缺陷的氢的起源
DOI:
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发表时间:
2019
期刊:
影响因子:
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通讯作者:
D. Macdonald
中科院分区:
文献类型:
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作者:
Chang Sun;W. Weigand;Jianwei Shi;Zhengshan J. Yu;R. Basnet;S. Phang;Z. Holman;D. Macdonald
Silicon heterojunction solar cell fabrication incorporates a significant amount of hydrogen into the silicon wafer bulk, and the amount of injected hydrogen is comparable to that introduced by silicon nitride films during a high-temperature firing step. In this work, the origins of the hydrogen injected during heterojunction cell processing have been identified. We demonstrate that the hydrogen plasma treatment that is routinely included to improve surface passivation considerably increases the hydrogen concentration in the wafers. We also show that the hydrogenated amorphous silicon i/p+ stack is more effective than the i/n+ stack for bulk hydrogen incorporation, and both are more effective than intrinsic films alone.Silicon heterojunction solar cell fabrication incorporates a significant amount of hydrogen into the silicon wafer bulk, and the amount of injected hydrogen is comparable to that introduced by silicon nitride films during a high-temperature firing step. In this work, the origins of the hydrogen injected during heterojunction cell processing have been identified. We demonstrate that the hydrogen plasma treatment that is routinely included to improve surface passivation considerably increases the hydrogen concentration in the wafers. We also show that the hydrogenated amorphous silicon i/p+ stack is more effective than the i/n+ stack for bulk hydrogen incorporation, and both are more effective than intrinsic films alone.