An Analysis of Multiple Similarity Measures for Ontology Mapping Problem
An Analysis of Multiple Similarity Measures for Ontology Mapping Problem
复制标题
本体映射问题的多重相似性测度分析
DOI:
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发表时间:
2010
影响因子:
0.8
通讯作者:
Ryutaro Ichise
中科院分区:
文献类型:
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作者:
Q.Liu;Y.Kawahara and T.Washio;Ryutaro Ichise