Multinomial Memristor Model for Simulations and Analysis

Multinomial Memristor Model for Simulations and Analysis
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用于仿真和分析的多项忆阻器模型

DOI:
10.1109/ised.2013.18
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发表时间:
2013
期刊:
2013 International Symposium on Electronic System Design
影响因子:
--
通讯作者:
D. Pradhan
D. Pradhan
中科院分区:
--
文献类型:
--
作者:
Liu Gang;J. Mathew;D. Pradhan

文献摘要

被引文献

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在本文中,我们提出了一种具有多项式窗函数的新型忆阻器模型。该模型描述了制造的器件可以表现出的行为范围,特别是具有所需非线性忆阻器特性的状态转换行为。该多项式窗函数可以通过拟合实际忆阻器器件的测量数据来获得。由于窗函数直接拟合测量数据,因此多项忆阻器模型表征了真实的忆阻器。
In this paper, we propose a novel memristor model with multinomial window function. The model describes the range of behaviours that a fabricated device can exhibit especially with respect to state transition behaviour with desired non-linear memristor characteristics. This multinomial window function can be obtained by fitting the measured data of a practical memristor device. Because the window function fits the measured data directly, the multinomial memristor model characterizes a real memristor.