Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows
Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows
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DOI：
10.1017/s1431927620000136
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发表时间：
2020-08-01
影响因子：
2.8
通讯作者：
Jourdan, Fred
中科院分区：
文献类型：
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作者：
Rickard, William D. A.;Reddy, Steven M.;Jourdan, Fred
原子探针断层扫描 (APT) 用于量化极小体积材料（通常是
Atom probe tomography (APT) is used to quantify atomic-scale elemental and isotopic compositional variations within a very small volume of material (typically