Glancing angle XRD analysis of particle stability under self-ion irradiation in oxide dispersion strengthened alloys
Glancing angle XRD analysis of particle stability under self-ion irradiation in oxide dispersion strengthened alloys
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DOI：
10.1016/j.scriptamat.2015.07.037
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发表时间：
2016-01-01
影响因子：
6
通讯作者：
Grovenor, C. R. M.
中科院分区：
文献类型：
--
作者：
London, A. J.;Panigrahi, B. K.;Grovenor, C. R. M.
我们使用掠射角X射线衍射（GIXRD）来研究Fe-14Cr-0.2Ti-0.3Y(2)O(3) ODS合金中氧化物纳米团簇的稳定性。高剂量自离子辐照会产生数百纳米深的受损层，通常需要耗时的特定地点技术来研究它们。我们已经证明，GIXRD 提供了一种通过改变入射角来研究损伤深度轮廓的有效方法，并且这些合金中的 Y2Ti2O7 纳米团簇会在 150 至 973 K 温度下受到高剂量辐照的破坏。(C) 2015 Acta Materialia Inc. 由 Elsevier Ltd 出版。保留所有权利。
We have used glancing-incident angle X-ray diffraction (GIXRD) to study the stability of oxide nanoclusters in an Fe-14Cr-0.2Ti-0.3Y(2)O(3) ODS alloy. High dose self-ion irradiation produces damaged layers a few hundred nanometres deep normally requiring time-consuming, site-specific techniques to study them. We have shown that GIXRD provides an effective way to study the damage depth profile by varying the incident angle, and that the Y2Ti2O7 nanoclusters in these alloys are disrupted by high dose irradiation at temperatures from 150 to 973 K. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.