Circularly polarized near-field scanning optical microscope for investigations of edge states of a two-dimensional electron system
Circularly polarized near-field scanning optical microscope for investigations of edge states of a two-dimensional electron system
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用于研究二维电子系统边缘态的圆偏振近场扫描光学显微镜
DOI：
10.1007/s00339-015-9420-9
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发表时间：
2015
期刊：
影响因子：
--
通讯作者：
Tatsushi Akazaki
中科院分区：
文献类型：
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作者：
Shintaro Nomura;Syuhei Mamyouda;Hironori Ito;Yusuke Shibata;Tomoya Ohira;Luno Yoshikawa;Youiti Ootuka;Satoshi Kashiwaya;Masumi Yamaguchi; Hiroyuki Tamura;Tatsushi Akazaki
我们报道了使用近场扫描光学显微镜对量子霍尔手性边缘态的研究，该显微镜使我们能够以低于衍射极限的空间分辨率从探针尖端照射圆偏振光。我们已经发现了在高磁场下二维电子系统边缘附近形成自旋分裂不可压缩条带的明确证据。
We report on investigations of the quantum Hall chiral edge states using a near-field scanning optical microscope that enables us to irradiate circularly polarized light from the probe tip with spatial resolution below the diffraction limit. We have found a clear evidence for the formation of spin-split incompressible strips near the edge of a two-dimensional electron system in high magnetic fields.