Optimization of specimen preparation of thin cell section for AFM observation
Optimization of specimen preparation of thin cell section for AFM observation
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AFM 观察薄细胞切片标本制备的优化
DOI：
10.1016/j.ultramic.2008.01.006
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发表时间：
2008-08-01
期刊：
影响因子：
2.2
通讯作者：
Sun, Jielin
中科院分区：
文献类型：
--
作者：
Li, Xinhui;Ji, Tong;Sun, Jielin
超薄细胞切片样品的细胞内结构的高分辨率成像是原子力显微镜精确操作的关键。在这里，我们测试了切片样品制备过程中多个因素对AFM图像质量的影响。这些因素包括包埋材料。试样块的退火工艺，截面厚度。和截面边。我们发现，无论是包埋材料还是退火过程的温度和速度对AFM图像分辨率都没有影响。然而，截面厚度和截面边长对表面形貌和AFM图像分辨率有显著影响。通过系统地测试在宽厚度范围内（40- 1000nm）细胞切片两侧的图像质量。我们发现，当上侧截面厚度约为50-100nm时，可以获得最佳分辨率。通过这些样品，我们可以观察到细胞的精确结构细节，包括它的膜，核仁。和其他细胞器。其他细胞类型也得到了类似的结果。包括Tca8113、C6。和ecv - 304。总之，通过优化条件制备超薄细胞切片。我们能够获得高分辨率的细胞内AFM图像，这为进一步的AFM操作提供了重要的基础。(c) 2008 Elsevier B.V.版权所有
High resolution imaging of intracellular structures of ultrathin cell section samples is critical to the performance of precise manipulation by atomic force microscopy (A FM). Here, we test the effect of Multiple factors during section sample preparation on the quality of the AFM image. These factors include the embedding materials. the annealing process of the specimen block,section thickness. and section side. We found that neither the embedding materials nor the temperature and speed of the annealing process has any effect on AFM image resolution. However, the section thickness and section side significantly affect the surface topography and AFM image resolution. By systematically testing the image quality of both sides of cell sections over a wide range of thickness (40-1000 nm). we found that the best resolution was obtained with upper-side sections approximately 50-100nm thick. With these samples, we Could observe Precise Structure details of the cell, including its membrane, nucleoli. and other organelles. Similar results were obtained for other cell types. including Tca8113, C6. and ECV-304. In brief, by optimizingg the condition o ultrathin cell section preparation. we were able to obtain high resolution intracellular AFM images, which provide an essential basis for further AFM manipulation. (c) 2008 Elsevier B.V. All rights reserved.