Crystallization, densification and dielectric properties of CaO-MgO-Al2O3-SiO2 glass with ZrO2 as nucleating agent
Crystallization, densification and dielectric properties of CaO-MgO-Al2O3-SiO2 glass with ZrO2 as nucleating agent
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DOI：
10.1016/j.materresbull.2014.09.058
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发表时间：
2014-12-01
影响因子：
5.4
通讯作者：
Wang, Chung-Ching
中科院分区：
文献类型：
--
作者：
Hsiang, Hsing-I;Yung, Shi-Wen;Wang, Chung-Ching
研究了氧化锆对CaO-MgO-Al_2O_3-SiO_2(CMAS)玻璃析晶和介电性能的影响。结果表明，在烧结过程中依次观察到层状硅氧化物和钙长石微晶。在玻璃中加入8wt%的氧化锆，在850℃下观察到了均匀分散的四方氧化锆微晶，所制备的微晶玻璃在100MHz时的介电常数约为6-7，介电损耗小于0.005。在850℃下烧结的含8wt%ZrO2的CMAS玻璃的介电性能较低，介电常数为6.65，介电损耗约为2.5×10(-3)，这为低温共烧陶瓷的应用提供了一种很有前景的候选材料。(C)2014爱思唯尔有限公司。保留所有权利。
The zirconium oxide effects on the crystallization and dielectric properties of CaO-MgO-Al2O3-SiO2 (CMAS) glass were investigated. The results showed that phyllosiloxide and anorthite crystallites were observed in sequence during sintering. For glass added with 8 wt% ZrO2, homogeneously dispersed tetragonal ZrO2 crystallites were observed at 850 degrees C. The as-prepared CMAS glass-ceramics exhibited a dielectric constant of about 6-7 and a dielectric loss below 0.005 at 100 MHz. The dielectric properties of CMAS glass with 8 wt% ZrO2 sintered at 850 degrees C show a low dielectric constant of 6.65 and a dielectric loss tangent of about 2.5 x 10(-3), which provides a promising candidate for LTCC applications. (C) 2014 Elsevier Ltd. All rights reserved.