Fault-tolerant error correction with the gauge color code.
Fault-tolerant error correction with the gauge color code.
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DOI：
10.1038/ncomms12302
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发表时间：
2016-07-29
影响因子：
16.6
通讯作者：
Browne DE
中科院分区：
文献类型：
--
作者：
Brown BJ;Nickerson NH;Browne DE
量子计算机的组成部分本质上容易受到错误的影响。为此，我们开发了量子误差校正代码，以保护量子信息免受噪声的侵害。但是，发现能够进行一套通用计算操作的代码，其量子资源的成本最低仍然是一个重要且持续的挑战。最近引起重大兴趣的一项建议是量规颜色代码。值得注意的是，该代码可以通过使用一种称为量规修复的新方法（用于执行对于通用量子计算必不可少的非clifford操作）来提供与其他易于耐心的耐故障结构相比，资源成本降低。在这里，我们检查尺寸颜色代码在受到噪声时。具体而言，我们利用单次误差校正来为仪表颜色代码开发简单的解码算法，并数值分析其性能。值得注意的是，我们发现阈值错误率与其他领先提案的阈值相当。因此，我们的结果提供了量规颜色代码与其他有希望的计算体系结构之间比较研究的第一步。
可扩展的量子计算机的构建需要错误校正的代码，以克服噪声引入的错误。在这里，作者为量规颜色代码开发了一种解码算法，并在包括物理错误和测量故障时获得其阈值。
The constituent parts of a quantum computer are inherently vulnerable to errors. To this end, we have developed quantum error-correcting codes to protect quantum information from noise. However, discovering codes that are capable of a universal set of computational operations with the minimal cost in quantum resources remains an important and ongoing challenge. One proposal of significant recent interest is the gauge color code. Notably, this code may offer a reduced resource cost over other well-studied fault-tolerant architectures by using a new method, known as gauge fixing, for performing the non-Clifford operations that are essential for universal quantum computation. Here we examine the gauge color code when it is subject to noise. Specifically, we make use of single-shot error correction to develop a simple decoding algorithm for the gauge color code, and we numerically analyse its performance. Remarkably, we find threshold error rates comparable to those of other leading proposals. Our results thus provide the first steps of a comparative study between the gauge color code and other promising computational architectures. Construction of a scalable quantum computer requires error-correcting codes to overcome the errors introduced by noise. Here, the authors develop a decoding algorithm for the gauge color code, and obtain its threshold values when physical errors and measurement faults are included.