Reaction control of tetraethyl orthosilicate (TEOS)/O3 and tetramethyl orthosilicate (TMOS)/O3 counter diffusion chemical vapour deposition for preparation of molecular-sieve membranes
Reaction control of tetraethyl orthosilicate (TEOS)/O3 and tetramethyl orthosilicate (TMOS)/O3 counter diffusion chemical vapour deposition for preparation of molecular-sieve membranes
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原硅酸四乙酯(TEOS)/O3 和原硅酸四甲酯(TMOS)/O3 反扩散化学气相沉积的反应控制用于制备分子筛膜
DOI:
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发表时间:
2000
期刊:
影响因子:
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通讯作者:
Q—Shin
中科院分区:
文献类型:
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作者:
Takeo Yamaguchi;Xin Ying;Yasuhiko Tokimasa;B. N. Nair;T. Sugawara;Q—Shin
Counter
diffusion chemical vapour deposition (CVD) is an excellent way to prepare inorganic thin films or membranes
on the surface of porous or non-porous supports. Modification of the pore size of porous supports by
this method to prepare molecular-sieve membranes is another interesting opportunity. However, control of the deposition
profile is very difficult because of the complex reaction kinetics. In this study, counter diffusion CVD
of tetraethyl orthosilicate (TEOS)/O3 or tetramethyl orthosilicate (TMOS)/O3 systems was investigated.
To control the deposition layer profile in a thin porous ceramic substrate, numerical simulations of the reaction sequences were performed. The reactant concentration and temperature were varied to control the deposition
profile, and the simulation results were compared with experimental results. It is shown that high
quality membranes can be processed under the optimised reaction conditions. In addition, the effect of step-coverage
of the CVD reaction on final
membrane performance
was also investigated
by comparison of the TEOS/O3 and TMOS/O3 reactions.