Model-free method for measuring the full Jones matrix of reflective liquid-crystal displays
Model-free method for measuring the full Jones matrix of reflective liquid-crystal displays
复制标题
用于测量反射液晶显示器全琼斯矩阵的无模型方法
DOI：
10.1117/1.3119309
复制
发表时间：
2009
影响因子：
1.3
通讯作者：
W. Osten
中科院分区：
文献类型：
--
作者：
C. Kohler;T. Haist;W. Osten
我们提出了一种测量包括液晶显示器琼斯矩阵符号在内的全部八个参数的方法。该方法可用于测量所有可寻址灰度级的琼斯矩阵，从而提供计算任意输入和输出极化的特性曲线所需的规格。与其他方法不同，我们不依赖LCD的物理模型。因此，可以在一个步骤中测量更复杂的光学系统的琼斯矩阵，例如，当反射式LCD与分束器结合使用时。虽然所提出的方法原则上是用于透射式和反射式LCD的应用电缆，但仅以反射式硅基液晶为例进行了计算和实验
We present a method for measuring all eight parameters in- cluding the signs of the Jones matrices of liquid-crystal displays. The method can be applied to measure the Jones matrices for all address- able gray levels thus delivering the specifications needed for calculating characteristic curves for arbitrary input and output polarizations. Unlike other approaches, we do not rely on a physical model of the LCD. Thus, it is possible to measure the Jones matrices of a more complex optical system in one step e.g., when a reflective LCD is used in combination with a beamsplitter. Though the method presented is, in principle, appli- cable for transmissive and reflective LCDs, calculations and experiments are only shown using the example of a reflective liquid-crystal-on-silicon