Imaging Plasmodium falciparum-infected ghost and parasite by atomic force microscopy
Imaging Plasmodium falciparum-infected ghost and parasite by atomic force microscopy
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DOI：
10.1006/jsbi.1997.3886
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发表时间：
1997-01-01
影响因子：
3
通讯作者：
Miyamoto, H
中科院分区：
文献类型：
--
作者：
Garcia, CRS;Takeuschi, M;Miyamoto, H
使用原子力显微镜对正常和恶性疟原虫感染的鬼影的膜细胞骨架网络进行成像。在正常细胞和感染细胞的风干鬼制剂中检查膜细胞骨架网络。我们发现受感染鬼魂的血影蛋白网络发生了变化。正常红细胞膜的厚度约为15.05 +/- 2.27 nm，而恶性疟原虫感染的细胞膜的厚度为22.97 +/- 3.84 nm。含有环期寄生虫的幽灵表现出尺寸范围为0.2至0.7μm的颗粒状突出区域。恶性疟原虫寄生虫的表面也在风干样本中成像，显示存在从寄生虫表面延伸的大突起。 (C) 1997 年学术出版社。
Atomic force microscopy was used to image the membrane cytoskeleton network of normal and P. falciparum-infected ghosts. The membrane cytoskeleton network was examined in air-dried ghost preparations from normal and infected cells. We found that the spectrin network was changed in infected ghosts. The thickness of the normal red cell membrane was about 15.05 +/- 2.27 nm, while the thickness of the P. falciparum-infected membrane was found to be 22.97 +/- 3.84 nm. The ghost containing ring stage parasites exhibited areas of particle-like protrusions ranging in size from 0.2 to 0.7 mu m. The surface of the P. falciparum parasite was also imaged in air-dried samples, showing the existence of a large protrusion extending from the parasite surface. (C) 1997 Academic Press.