Theoretical and experimental study of resonant inelastic X-ray scattering for NiO
Theoretical and experimental study of resonant inelastic X-ray scattering for NiO
复制标题
DOI：
10.1016/j.radphyschem.2005.07.025
复制
发表时间：
2006-11-01
影响因子：
2.9
通讯作者：
Braicovich, L.
中科院分区：
文献类型：
--
作者：
Kotani, A.;Matsubara, M.;Braicovich, L.
对 NiO 的 Ni 2p 至 3d 激发和 3d 至 2p 去激发的共振非弹性 X 射线散射 (RIXS) 谱进行了理论和实验研究。采用单杂质安德森模型（SIAM）进行理论计算，描述了RIXS中的电荷转移（CT）和d-d激发，并对CT能量进行了详细研究。高分辨率 RIXS 测量揭示了精确的 d-d 激发结构及其偏振依赖性，并且它们可以通过 SIAM 计算很好地再现。 (c) 2006 Elsevier Ltd. 保留所有权利。
Resonant inelastic X-ray scattering (RIXS) spectra for Ni 2p to 3d excitation and 3d to 2p de-excitation of NiO are studied both theoretically and experimentally. Theoretical calculations with a single impurity Anderson model (SIAM) describe the charge transfer (CT) and d-d excitations in RIXS, and detailed study is made for the CT energy. High resolution RIXS measurements reveal the precise d-d excitation structure and its polarization dependence, and they are well reproduced by the SIAM calculation. (c) 2006 Elsevier Ltd. All rights reserved.