LOW THERMAL EMITTANCE MEASUREMENTS AT THE PSI-XFEL LOW EMITTANCE GUN TEST FACILITY
LOW THERMAL EMITTANCE MEASUREMENTS AT THE PSI-XFEL LOW EMITTANCE GUN TEST FACILITY
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PSI-XFEL 低发射枪测试设施的低热发射测量
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
P. Scherrer
中科院分区：
文献类型：
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作者：
Y. Kim;Å. Andersson;M. Dach;R. Ganter;T. Garvey;C. Gough;C. Hauri;R. Ischebeck;F. L. Pimpec;M. Paraliev;M. Pedrozzi;T. Schietinger;V. Schlott;Bernd Steffen;A. Wrulich;P. Scherrer
为了检查PSI-XFEL项目计划的低发射度电子枪的性能，PSI于2007年建造了一个500 kV脉冲二极管电子枪测试设施。该枪被特别设计为在阴极和阳极之间具有可调节的间隙，并允许进行广泛的高梯度测试。由于阴极处的电子温度决定了最小可实现的切片发射度，因此我们集中精力测量金刚石车削铜阴极的热发射度。在最小化发射度测量方法中来自非线性电磁RF场、线性和非线性空间电荷力、色效应和图像噪声的发射度贡献后，我们在40 MV/m下获得了约0.2 μm的小热发射度，其中使用铜阴极，光电阴极上的均方根激光束光斑尺寸约为330 μm。在本文中，我们报告了我们的低热发射率测量结果与金刚石车削铜阴极在LEG设施。
To check the performance of a planned low emittance gun for the PSI-XFEL project, a 500 kV pulsed diode based gun test facility was constructed at PSI in 2007. The gun was specially designed to have an adjustable gap between the cathode and the anode, and to allow extensive high gradient tests. Since the electron temperature at the cathode determines the minimum achievable slice emittance, we concentrated our efforts on measuring the thermal emittance of a diamond turned copper cathode. After minimizing emittance contributions from nonlinear electromagnetic RF fields, linear and nonlinear space charge forces, chromatic effects, and image noise in the emittance measurement method, we obtained a small thermal emittance of about 0.2 μm with the copper cathode for the rms laser beam spotsize on the photo-cathode of about 330 μm at 40 MV/m. In this paper, we report on our low thermal emittance measurement results with a diamond turned copper cathode at the LEG facility.