Accurate De-Embedding and Measurement of Spin-Torque Oscillators
Accurate De-Embedding and Measurement of Spin-Torque Oscillators
复制标题
自旋扭矩振荡器的精确去嵌入和测量
DOI：
10.1109/tmag.2017.2752004
复制
发表时间：
2017
影响因子：
2.1
通讯作者：
D. Ricketts
中科院分区：
文献类型：
--
作者：
M. Abbasi;B. Wang;S. Tamaru;H. Kubota;A. Fukushima;D. Ricketts
我们提出了一种方法，用于准确地去嵌入的偏置和测量电极结构用于自旋扭矩振荡器（STO）测量的电效应。我们提出了一个简单的，但非常准确的方法，每个STO晶片只需要一个额外的测试结构。我们表明，电极结构的影响，包括相移频率和插入损耗，可以被删除，提供一个准确的测量真正的STO参数。我们的方法是验证使用24 STO在四个不同的晶圆，每个包含140 STO。
We present a method for accurately de-embedding the electrical effects of the bias and measurement electrode structure used for spin-torque oscillator (STO) measurements. We propose a simple, but very accurate, method that requires only one additional test structure per STO wafer. We show that the effects of the electrode structure, including phase shift over frequency and insertion loss, can be removed, providing an accurate measurement of the true STO parameters. Our method is verified using 24 STOs across four different wafers each containing 140 STOs.