Resonant formation of DNA strand breaks by low-energy (3 to 20 eV) electrons
Resonant formation of DNA strand breaks by low-energy (3 to 20 eV) electrons
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DOI：
10.1126/science.287.5458.1658
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发表时间：
2000-03-03
期刊：
影响因子：
56.9
通讯作者：
Sanche, L
中科院分区：
文献类型：
--
作者：
Boudaïffa, B;Cloutier, P;Sanche, L
通过电离辐射沉积在细胞中的大部分能量被引导到产生大量的自由二次电子，其弹道能量在1和20电子伏之间。在这里，它表明，这种电子的反应，即使在能量远低于电离阈值，诱导大量的产量的单链和双链断裂的DNA，这是由快速衰减的瞬态分子共振定位在DNA的基本组成部分。这一发现提出了一个根本性的挑战，传统的观念，遗传毒性损伤的二次电子只能发生在能量以上的电离开始，或溶剂化时，他们成为一个缓慢反应的化学物种。
Most of the energy deposited in cells by ionizing radiation is channeled into the production of abundant free secondary electrons with ballistic energies between 1 and 20 electron volts. Here it is shown that reactions of such electrons, even at energies well below ionization thresholds, induce substantial yields of single- and double-strand breaks in DNA, which are caused by rapid decays of transient molecular resonances Localized on the DNA's basic components. This finding presents a fundamental challenge to the traditional notion that genotoxic damage by secondary electrons can only occur at energies above the onset of ionization, or upon solvation when they become a slowly reacting chemical species.