Modeling Quantum Noise for efficient testing of fault-tolerant circuits
Modeling Quantum Noise for efficient testing of fault-tolerant circuits
复制标题
模拟量子噪声以有效测试容错电路
DOI：
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
D. Cory
中科院分区：
文献类型：
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作者：
E. Magesan;D. Puzzuoli;C. Granade;D. Cory
作者声明：作者声明：Granade，3和大卫G. Cory 4，5 Institute for Quantum Computing，University of Waterloo，Waterloo，ON N2L 3G1，Canada Department of Applied Mathematics，University of Waterloo，Waterloo，ON N2L 3G1，Canada Department of Physics and Astronomy，University of Waterloo，Waterloo，ON N2L 3G1，Canada Department of Chemistry，University of Waterloo，Waterloo，ON N2L 3G1，Canada Perimeter Institute for Theoretical Physics Waterloo，ON N2L 2Y5，Canada
Easwar Magesan, 2 Daniel Puzzuoli, 2 Christopher E. Granade, 3 and David G. Cory 4, 5 Institute for Quantum Computing, University of Waterloo, Waterloo, ON N2L 3G1, Canada Department of Applied Mathematics, University of Waterloo, Waterloo, ON N2L 3G1, Canada Department of Physics and Astronomy, University of Waterloo, Waterloo, ON N2L 3G1, Canada Department of Chemistry, University of Waterloo, Waterloo, ON N2L 3G1, Canada Perimeter Institute for Theoretical Physics, Waterloo, ON N2L 2Y5, Canada