High-temperature superconducting edge-type Josephson junctions with modified interface barriers

High-temperature superconducting edge-type Josephson junctions with modified interface barriers
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具有改进的界面势垒的高温超导边缘型约瑟夫森结

DOI:
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发表时间:
1999
期刊:
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通讯作者:
S. Tanaka
S. Tanaka
中科院分区:
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文献类型:
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作者:
T. Satoh;J. Wen;M. Hidaka;S. Tahara;N. Koshizuka;S. Tanaka

文献摘要

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本文介绍了高温超导边缘型约瑟夫森结的制作,电特性和微结构的修改界面势垒的最新结果。通过对YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//基极层进行表面改性来形成势垒。该过程涉及通过离子照射进行结构和化学修饰以及通过退火进行结晶。结表现出电容性和电容性分流的结样电流-电压特性和良好的均匀性。在4.2K下,100个结的临界电流的分布小于1/spl σ/=10%。均匀性现在接近1/spl sigma/= 5%。在室温下储存两年后,结特性保持不变。它们在约700/spl deg/C的高温处理后也没有显示出变化。高分辨透射电子显微镜显示,无论是晶体结构和化学成分在相对较厚的障碍是不同的YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//。
This paper describes recent results on the fabrication, electrical characteristics, and microstructure of high-temperature superconducting edge-type Josephson junctions with modified interface barriers. The barriers are formed by surface modification of the YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// base layer. This process involves structural and chemical modification by ion irradiation and crystallization by annealing. The junctions showed resistively and capacitively shunted junction-like current-voltage characteristics and excellent uniformity. The spread in the critical current for one hundred junctions was smaller than 1/spl sigma/=10% at 4.2 K. The uniformity is now approaching 1/spl sigma/=5%. The junction characteristics have remained the same after two-year room-temperature storage. They also showed no change after high-temperature processing at about 700/spl deg/C. High-resolution transmission electron microscopy revealed that both the crystal structure and chemical composition in relatively thick barriers are different from those of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//.